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TTTC's Electronic
Broadcasting Service
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TTTC E. J. McCluskey Best Doctoral Thesis Award at IEEE VLSI Test Symposium 2017
(VTS'17) |
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CALL FOR
PARTICIPATION
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The Contest |
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As part of the 2017 IEEE VLSI Test Symposium (VTS’17), the TTTC Student Activities Committee is organizing one of the semi-finals of the TTTC’s E. J. McCluskey Best 2017 Doctoral Thesis Award contest. The other semi-finals will be held at the IEEE European Test Symposium (ETS), the IEEE Latin American Test Symposium (LATS) and the IEEE Asian Test Symposium (ATS). The winners of the four semi-finals, determined by juries composed of academics and industrial experts, will compete against each other in the finals, held at the IEEE International Test Conference (ITC’17). |
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Eligibility and Logistics |
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All four semi-final sites are seeking submissions from active doctoral students working on test-related topics. An individual can only participate in the contest once in a lifetime. Prospective participants are encouraged to participate when they are close to thesis completion and have obtained sufficient results. Submissions to multiple regional sites are prohibited. Prospective contestants must submit a one-page (A4) summary of their thesis (One additional page is allowed for figures and references). Submissions must include the names of the student, one advisor and start/end dates, and will undergo a selection process. Selected contestants will be given a short (7-minute) presentation slot in a designated technical session. The winner will be determined by the jury and announced during the event. |
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Submission |
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Submission is done by email through your local and global coordinators. Please submit through the local coordinator Naghmeh Karimi <naghmeh.karimi@umbc.edu >. |
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For more
information, visit us on the web at: http://www.tttc-vts.org
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The
IEEE VLSI TEST SYMPOSIUM is sponsored by the Institute of
Electrical and Electronics Engineers (IEEE) Computer Society's Test
Technology Technical Council (TTTC).
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IEEE Computer Society- Test Technology Technical
Council
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